Enhancing Manufacturing Potential: Scan-to-BIM for Burberry Facilities
- Client
- Cushman & Wakefield
- Sector
- Manufacturing and Retail
Parametrix delivered interdisciplinary Scan-to-BIM services for two Burberry manufacturing facilities, providing precise digital models and outputs to support future expansion decisions.
The Burberry manufacturing sites in Castleford and Keighley presented distinct challenges rooted in their age and the layered architectural changes from years of adaptive reuse. Strict security protocols and 24/7 operations limited access and required careful planning to avoid disruption. Capturing accurate data across these expansive facilities demanded complex logistical coordination. At the time, technological limitations added further difficulty in processing and managing the vast datasets required for effective digital modelling.
We delivered a comprehensive Scan-to-BIM programme for Burberry’s Castleford and Keighley sites. Using laser scanning and drone surveys, we captured internal and external data to produce fully coordinated digital twins covering architecture, structure, MEP, and site context.
The models supported design proposals, energy analysis, and feasibility studies, helping Burberry assess extension versus new build options. Deliverables included high-detail 3D models to LOD standards, 2D as-built drawings, and visual outputs like drone footage and stakeholder-ready visualisations.
The completed Scan-to-BIM project provided Burberry and Cushman & Wakefield with accurate, data-rich models to assess current facility performance and guide future development decisions. Parametrix’s precision data capture and coordinated modelling enabled energy analysis, space planning, and design feasibility within active, high-security environments.
The digital record supports long-term asset strategy while showcasing the impact of BIM in complex, operational settings. This project highlighted how thoughtful application of digital methods can overcome real-world constraints and deliver lasting value.
